[2023]

1. Wonyeong Choi, Seonghwan Shin, Jeonghyeon Do, Jongmin Son, and Jeong-Soo Lee, "Sensing Characteristics of Si-based Nanowire BioFETs for Detection of Urea", World Congress on Biosensors, Busan, Korea, Jun 5-8, 2023. 

2. Seonghwan Shin, Wonyeong Choi, Jeonghyeon Do, Jongmin Son, and Jeong-Soo Lee, "Aptamer-functionalized Si-Nanonet Electrolyte-Gated Field Effect Transistor (EGT) for Detection of COVID-19", World Congress on Biosensors, Busan, Korea, Jun 5-8, 2023. 

3. Jounghun Park, Gilsang Yoon, Donghyun Go, Donghwi Kim, Ukju An, Jongwoo Kim, Jungsik Kim, and Jeong-Soo Lee, "Decomposition of Vertical and Lateral Charge Loss in Long-term Retention of 3-D NAND Flash Memory", IEEE International Reliability Physics Symposium (IRPS), Monterey, California, USA, Mar 26-30, 2023. 

4. Ukju An, Gilsang Yoon, Donghyun Go, Jounghun Park, Donghwi Kim, Jongwoo Kim, and Jeong-Soo Lee, "Temperature-induced Instability of Retention Characteristics in 3-D NAND Flash Memory", IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Seoul, Korea, Mar 7-10, 2023. 

[2021]

5. Jounghun Park, Gilsang Yoon, Donghyun Go, Donghwi Kim, Jungsik Kim, and Jeong-Soo Lee, "Analysis of Vt Gain and Related Lateral Migration Using Program-Erase-Program Pattern in 3-D NAND Flash Memory", International Conference on Solid State Devices and Materials (SSDM), ALL-VIRTUAL, Sep 6-9, 2021. 

6. Donghyun Go, Gilsang Yoon, Jounghun Park, Donghwi Kim, Jungsik Kim, and Jeong-Soo Lee, "Electrical Variations of Non-Circular Cell Structure in 3D NAND Flash Memory Using TCAD-Machine Learning Framework", NANO KOREA 2021 Symposium, KINTEX, Goyang, Korea, July 7-9, 2021.

7. Gilsang Yoon, Donghyun Go, Jaeseok Jin,  Jounghun Park, Jungsik Kim, and Jeong-Soo Lee, "Impact of P/E cycling stress on trap distributions in tunneling and blocking layers for 3-D VNAND flash memory applications", International Conference on Electronics, Information, and Communication (ICEIC),  Jeju, Korea, Jan 24-27, 2021.

8. Jounghun Park, Gilsang Yoon, Jaeseok Jin, Donghyun Go, Jungsik Kim, and Jeong-Soo Lee, "Effects of Trap Charges in Spacer Region on Retention Variation in 3-D NAND Memory Cells", International Conference on Electronics, Information, and Communication (ICEIC), Jeju, Korea, Jan 24-27, 2021.

9. Iksoo Park, Donghun Lee, and Jeong-Soo Lee, "Analysis of atomic behavior of carbon during nickel silicide formation by atom probe tomography", International Conference on Electronics, Information, and Communication (ICEIC), Jeju, Korea, Jan 24-27, 2021.

[2017]

10. Hyeongwan Oh, Jiwon Kim, Rock-Hyun Baek, and Jeong-Soo Lee, "Vth variation of string SONOS NAND Flash depending on single grain boundary and stored electron charges in an adjacent cell", International Conference on Solid State Devices and Materials (SSDM), Sendai, Japan Sep 19-22, 2017.

11. Junyoung Lee, Hojoon Lee, Sangwon Baek, Gilsang Yoon, and Jeong-Soo Lee, "Fabrication and Characterization of Sub-micron LTPS TFT with Various Width and Length", NANO KOREA 2017 Symposium, KINTEX, Korea, July 12-14, 2017.         

12. Donghoon Kim, Chanoh Park, Kihyun Kim, Bo Jin, Wonyoung Choi, and Jeong-Soo Lee, "Enhanced Gas Sensing Performances of Nove Si-Nanonet-Channel Resistive Sensor", NANO KOREA 2017 Symposium, KINTEX, Korea, July 12-14, 2017.

13. Saebyuk Jeong, Donghoon Kim, Chanoh Park, Rock-Hyun Baek, Bo. Jin, and Jeong-Soo Lee,  "Improving DMMP(Salin simulant) Sensing Characteristics of TFQ Functionalized Graphene Chemiresistive Sensors", IEEE international Conference, Pitts Marriott City Center, USA, July 25-28, 2017.

14. M. Choi, T. Kim, J.-S. Lee and B. Kim, "An Analysis on Tolerance to Linewidth Mismatch De-embedding Semiconductor Wires," International Microwave Symposium, USA, June 4-9, 2017

[2016]

15. B. Jin, C. Park, and K. Kim, J.-S. Lee, "Highly Sensitive BioFETs with 3-Dimensional Nanonet Channel for Biosensing Applications", UKC 2016, Dallas, Texas, USA, Aug. 10-13, 2016

16. J. Kim, H. Oh, J. Kim Member, IEEE, and J.-S. Lee, SeniorMember, “Effects of Work-function Variation on Analog Figures-of-merits of Inversion-mode and Junctionless Nanowire Transistors”, IEEE Nano, Sendai Japan, Aug. 22-25, 2016

17. N. Hong, C. Park, D. Kim, K. Jeong, J. Yoon, B. Jin, and J.-S. Lee, “Effect of surface functional groups on the pH sensitivity in ion-sensitive field effect transistors”, IEEE Nano, Sendai Japan, Aug. 22-25, 2016

18. J. Lee, H. Lee, B. Jin, J. Kim, H. Oh, and J.-S. Lee, “Fabrication and Characterization of Vertical Poly-Si Thin-Film Transistor”, NANO KOREA 2016 Symposium, KINTEX, Korea, July 13-15, 2016.

19. H. Lee, J. Lee, B. Jin, and J.-S. Lee, “Investigation of 1/f Noise Characteristics in Junctionless Poly-Si Thin-Film Transistors under Hot Carrier Injection”, NANO KOREA 2016 Symposium, KINTEX, Korea, July 13-15, 2016.

20. S. Baek, B. Jin, C. Park, J.-S. Lee, “Investigation of oxide traps at SiC/SiO2 interfacial layer in SiC DMOSFET for high-power applications”, NANO KOREA 2016 Symposium, KINTEX, Korea, July 13-15, 2016.

[2015]

21. J. Kim, H. Oh, B. Jin, C.-K. Baek, and J.-S. Lee, "The Electrical Variations due to Grain Boundary using Voronoi Method in Tunneling Field-Effect-Transistor (TFET) of Polysilicon Nanowire Channel," NANO KOREA 2015 Symposium, Seoul(Coex), Korea, July 1-3, 2015

22. H. Oh, J. Kim, B. Jin, C.-K. Baek, and J.-S. Lee, “Electrical Variation of Vertical Macaroni NAND Cells due to Random Grain Boundary Using Voronoi Method," NANO KOREA 2015 Symposium, Seoul(Coex), Korea, July 1-3, 2015.

23. C. Park, K. Kim, D. Kim, N. Hong, M. Meyyappan, and J. –S. Lee, “Effects of Buffer Concentration on Sensing Performances of Ion-Sensitive Field-Effect Transistors with Si-Nanowires”, IEEE Nano, Rome, Italy, July 27-30, 2015

24. I. Lee, C. Park, D. Kim, J.-S. Lee, and B. Kim, “A Threshold Voltage Variation Calibration Algorithm for An ISFET-Based Low-Cost pH Sensor System,” IEEE Sensors, Busan, Korea, pp. 1-4, Nov., 1st-4th, 2015

[2014]

25. J. Kim, J. Lee, H.G. Oh, T. Rim, C.-K. Baek, M. Meyyappan, and J.-S. Lee, “The Variability due to Random Discrete Dopant and Grain Boundary in 3D NAND Unit Cell”, IEEE Nanoelectronics Conference, Sapporo, Hokkaido, Japan, Jul. 28-31, 2014.

26. J.-S. Lee, M. Meyyappan, “Novel biosensor platform based on Si-nanowire-Network Structure”, IEEE Nanoelectronics Conference, Sapporo, Hokkaido, Japan, Jul. 28-31, 2014.

27. T. Kim, Y. Chung, O. Kwon, and J.-S. Lee, “Blue Nano-Flower Photonic Quantum Ring Laser”, The 12th Nano Korea symposium, Coex, Seoul, Korea, Jul. 2-4, 2014.

28. D.G. Kang, T. Rim, C.-H. Baek, M. Meyyappan, J.-S. Lee, “Analysis of atomic migration in In2Se3 nanowire for phase change memory applications”, The 12th Nano Korea symposium, Coex, Seoul, Korea, Jul. 2-4, 2014.

29. B. Jin, T.K. Lim, S.H. Ju, M. Meyyappan, and J.-S. Lee, "Improved phase transition performance of Ga-doped indium oxide nanowire phase change random access memory with encapsulating layer," The 12th Nano Korea symposium, Coex, Seoul, Korea, Jul. 2-4, 2014.

30. H.G. Oh, J. Kim, J. Lee, C.-H. Baek and J.-S. Lee, “Effects of Grain Boundary Traps on Electrical Variation in 3D Vertical NAND Flash Memory Cell with Macaroni Channel Structure”, The 12th Nano Korea symposium, Coex, Seoul, Korea, Jul. 2-4, 2014.

31. K. Kim, C. Park, T. Rim, M. Meyyappan, and J. S. Lee, "Electrical and pH Sensing Characteristics of Si Nanowire-Based Suspended FET Biosensors," The 14th International Conference on Nanotechnology, Toronto, Canada, Aug. 18-21, 2014.

32. T. Rim, S. Kim, K. Kim, N. Hong, J. S. Lee, Y. H. Jeong, M. Meyyappan, and C. K. Baek, "Noise Consideration for Cancer Marker Detection using Nanowire Sensors," The 14th International Conference on Nanotechnology, Toronto, Canada, Aug. 18-21, 2014.

33. J. Kim, H. Oh, J. Lee, B. Jin, T. Rim, C.-K. Baek, M. Meyyappan, J.-S. Lee, “The Temperature Dependence of Threshold Voltage Variations due to Oblique Single Grain Boundary in 3D NAND Unit Cells”, Non-Volatile Memory Technology Workshop, Jeju-Do, Korea, Oct. 27-29, 2014.

34. E. Y. Jeong, M. J. Deen, C. H. Chen, R. H. Baek, J. S. Lee, and Y. H. Jeong, "Physical DC and Thermal Noise Models of 18nm DG Junctionless pMOSFETs," 2014 International Conference on Solid State Devices and Materials, Tsukuba, Japan, Sep. 2014.

35. J. S. Yoon, E. Y. Jeong, S. H. Lee, Y. R. Kim, J. H. Hong, J. S. Lee, and Y. H. Jeong, "Extraction of Source/Drain Series Resistance Components Optimized for Double-gate FinFETs," 2014 International Conference on Solid State Devices and Materials, Tsukuba, Japan, Sep. 2014.

36. J. H. Hong, S. H. Lee, Y. R. Kim, E. Y. Jeong, J. S. Yoon, J. S. Lee, R. H. Baek, and Y. H. Jeong, "Impact of High-ĸ Spacers on Parasitic Effects Considering DC/AC Performance Optimization in Si-Nanowire FETs for sub 10 nm Technology Node," 2014 International Conference on Solid State Devices and Materials, Tsukuba, Japan, Sep. 2014.

[2013]

37. B. Jin, J. Kim, D. Kang, M. Meyyappan, and J.-S. Lee, "Size-dependent Characteristics of Highly-scalable In2Se3 Nanowire Phase-change Random Access Memory," The 13th IEEE International Conference on Nanotechnology, Beijing, China, Aug. 5-8, 2013.

38. T. Rim, K. Kim, N. Hong, W. Ko, C. Park, C.-K. Baek, M. J. Deen, M. Meyyappan, S. Jeon, Y.-H. Jeong, and J.-S. Lee, “Silicon Nanowire Bio-Field Effect Transistor with Embedded Ag/AgCl Pseudo Reference Electrode,” 5th International Symposium on IT convergence Engineering, Pohang, Korea, Jul. 11-12, 2013.

39. B. Jin, D. Kang, J. Kim, H. Oh, M. Meyyappan, and J.-S. Lee, “Diameter-related Characteristics of In2Se3 Nanowire Based Phase Change Memory,” 5th International Symposium on IT convergence Engineering, Pohang, Korea, Jul. 11-12, 2013.

40. S, Jeong, B, Choi, and J.-S. Lee, “Graphene Field Effect Transistor with High-k Gate Dielectric on Flexible Stainless Steel (STS) Substrate,” 5th International Symposium on IT convergence Engineering, Pohang, Korea, Jul. 11-12, 2013.

41. S. Baek, H. Park, J. Kim, and J.-S. Lee, “Silicidation for Forming Low Contact Resistance of Ohmic Contact on 4H-SiC using Ni and Ti/Ni Layer,” 5th International Symposium on IT convergence Engineering, Pohang, Korea, Jul. 11-12, 2013.

42. T. Kim, O. Kwon, and J.-S. Lee, “Fabrication and Characterization of Blue Nano Photonic Quantum Ring Laser,” 5th International Symposium on IT convergence Engineering, Pohang, Korea, Jul. 11-12, 2013.

43. J. Kim, J. Lee, C.-K. Baek, and J.-S. Lee, “Simulation Study of Random Discrete Dopants and Grain Boundary in Polysilicon Channel FETs,” 5th International Symposium on IT convergence Engineering, Pohang, Korea, Jul. 11-12, 2013.

44. H. Lee, K. Kim, and J.-S. Lee, “Growth of SiGe Epitaxial Layer Using UHV-CVD for Multi-Stacked Suspended Nanostructures,” 5th International Symposium on IT convergence Engineering, Pohang, Korea, Jul. 11-12, 2013.

45. C.-H. Park, M.-D. Ko, K. Kim, J.-H. Hong, R.-H. Baek, J. S. Yoon, J.-S. Lee, and Y.-H. Jeong, "Extraction of Series Resistance on Junctionless and Inversion-mode nanowire FET through the Method based on Y-function," 2013 71st Annual Device Research Conference, Notre Dame, USA, Jun. 23-26, 2013.

46. S.-H. Lee, Y.-R. Kim, J. H. Hong, E.-Y. Jeong, J. W. Jang, J.-S. Yoon, D. W. Kim, C.-K. Baek, J.-S. Lee, and Y.-H. Jeong, "Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects," 2013 71st Annual Device Research Conference, Notre Dame, USA, Jun. 23-26, 2013.

47. S.-J. Joo, S. Baek, S.-C. Kim, J.-S. Lee, “Simultaneous formation of ohmic contacts on p- and n-type 4H-SiC using Ti/Ni double layer system,” Materials Research Society spring meeting, San Francisco, California, Apr. 1-5, 2013.

48. J.-S. Lee, “Si nanowire Biological Field Effect Transistors (BioFETs) using microfabrication technology,” Da Nang, Vietnam, Mar. 18-23, 2013. (invited talk)

[2012]

49. C.-W. Sohn, M.-D. Ko, C. Y. Kang, R.-H. Baek, D.-Y. Choi, H.-C. Sagong, E.-Y. Jeong, C.-K. Baek, J.-S. Lee, P. Kirsch, R. Jammy, J. Lee, and Y.-H. Jeong, "Modeling and Analysis of the Parasitic Series Resistance in Raised Source/Drain FinFETs with Polygonal Epitaxy," International Conference on Simulation of Semiconductor Processes and Devices, Denver, Colorado, USA, Sep. 5-7, 2012.

50. C.-H. Park, M.-D. Ko, K. Kim J.-S. Lee, and Y.-H. Jeong, "Investigation on hot carrier effects in n-type short-channel junctionless nanowire transistors,” 12th International Conference on Nanotechnology, Birmingham, UK, Aug. 20-23, 2012.

51. H. Faryabi, K. Davami, N. Kheirabi, M. Shaygan, J.-S. Lee, and M. Meyyappan, “Enhancement of electrical properties of ZnTe nanowires,” The 10th Nano Korea symposium, Coex, Aug. 16-18, 2012.

52. N. Kheirabi, K. Davami, J. Pohl, M. Shaygan, H. Faryabi, G. Cuniberti, J.-S. Lee, and M. Meyyappan, “Band gap modulation in VLS-grown CdxZn1-xTe alloy nanowires,” The 10th Nano Korea symposium, Coex, Aug. 16-18, 2012.

53. M. Shaygan, K. Davami, N. Kheirabi, H. Faryabi, J.-S. Lee, G. Cuniberti1, and M. Meyyappan, “Effective Parameters on Growth Conditions of CdTe Nanowires Synthesized by Vapor-liquid-Solid Method,” The 10th Nano Korea symposium, Coex, Aug. 16-18, 2012.

54. U. Lee, T. Rim, S. H. Kim, K. Kim, N.-K. Hong, M. Meyyappann, M. J. Deen, and J.-S. Lee, “Uric acid detection using Si-nanowire Ion-Sensitive Field Effect Transistors,” The 10th Nano Korea symposium, Coex, Aug. 16-18, 2012.

55. S. H. Kim, T. Rim, K. Kim, E. Baek, U. Lee, N.-K. Hong, C.-K. Baek, S.-Y. Park, J.-S. Lee, and Y.-H. Jeong, "Determination of Operation Region in Silicon-Nanowire BioFETs to Maximize Signal-to-Noise Ratio,” International Conference on Superlattices, Nanostructures, and Nanodevices, Dresden, Germany, Jul. 22-27, 2012.

56. D.-Y. Choi, C.-W. Sohn, H.-C. Sagong, E.-Y. Jeong, J.-W. Jang. C.-K. Baek, J.-S. Lee, and Y.-H. Jeong, "Intrinsic Reliability Improvement of SiGe Quantum Well pMOSFETs," International Conference on Superlattices, Nanostructures, and Nanodevices, Dresden, Germany, Jul. 22-27, 2012.

57. J. Lee, C. Baek, S. Park, J. Kim, J. Kim, and J.-S. Lee, “Comparative Analysis of SONOS Memory Characteristic in Planar, Double Gate, and Nanowire Structure”, 4th International Symposium on IT convergence Engineering, Pohang, Korea, Jul. 12-13, 2012.

58. J.-S. Lee, "Si nanowire ion-sensitive field effect transistors (ISFETs) for biosensor application,” Workshop on application of nanotechnology in modern energy concepts, Dresden, Germany, Jun. 4-9, 2012.

59. C.-W. Sohn, C.-Y. Kang, R.-H. Baek, D.-Y. Choi, H.-C. Sagong, E.-Y. Jeong, J.-S. Lee, P. Kirsch, R. Jammy, J. C. Lee, and Y.-H. Jeong, "Comparative Study of Geometry-dependent Capacitances of Planar FETs and Double-Gate FinFETs: Optimization and Process Variation,” VLSI Technology, Systems and Applications (VLSI-TSA), Hsinchu, Taiwan, Apr. 23-25, 2012.

60. J.-S. Lee, “Sensing and Noise Characteristics of Si-Nanowire Ion-Sensitive Field-Effect-Transistors for Future Biosensor Applications ,” The 7th IEEE-NEMS(IEEE International Conference 2011), Kyoto, Japan, Mar. 5-8, 2012. (Invited talk)

[2011]

61. J.-S. Lee, S. Kim, K. Kim, T. Rim, Y.-H. Jeong, and M. Meyyappan, "Nanoscale Silicon lon-Sensitive Field-Effect Transistors for pH Sensor and Biosensor," IEEE EDSSC (Electron Devices and Solid-State Circuits), Tianjin, China, Nov. 17-18, 2011. (Invited talk) “Si-Nanowire Ion-Sensitive Field-Effect Transistors (ISFETs) for pH Sensor and Biosensor Applications” (다른 이름)

62. D. Lee, K. Lee, S. Jeong, J. Lee, B. Choi, J.-S. Lee and O. Kim, “Process optimization for synthesis of high-quality graphene films by low-pressure chemical vapor deposition,” 24th International Microprocesses and Nanotechnology Conference 2011, The Japan Society of Applied Physics, JA, Oct. 25, 2011.

63. K. Davami, D. Kang, K. Kim, G. Cuniberti, H. Roman, J.-S. Lee, and M. Meyappan, "Positioning Nanostructures via DNA Origami Templates on a MEMS Device for Thermoelectric Characterization," IEEE NMDC (Nanotechnology Materials and Devices Conference), Jeju, Korea, Oct. 18-21, 2011.

64. Y.-R. Kim, S.-H. Lee, C.-K. Baek, R.-H. Baek, K. H. Yeo, D. W. Kim, J.-S. Lee, and Y.-H. Jeong, "Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique," 2011 IEEE Nanotechnology Materials and Devices Conference, JeJu island, Korea, Oct. 19-21, 2011.

65. N. Agoulmine, M.J. Deen, J.-S. Lee, and M. Meyyappan, “U-Health Smart Home: Role of Nanotechnology,” IEEE Nano Magazine, 2011.

66. E.-Y. Jeong, H.-C. Sagong, D.-Y. Choi, C.-W. Sohn, J.-S. Lee, C. Y. Kang, and Y.-H. Jeong, "Hot Carrier Effect on RF Characteristics of High-k/Metal Gate SiGe Channel pMOSFETs," 2011 International Conference on Solid State and Device Materials, Nagoya, Japan, Sep. 28-30, 2011.

67. M.-D. Ko, S.-H. Lee, R.-H. Baek, C.-H. Park, C.-W. Sohn, C.-K. Baek, J.-S. Lee,and  Y.-H. Jeong, "Analysis of Bottom Channel Effect in Silicon Nanowire FET based on Bulk-Silicon: Reduction of Parasitic Capacitance caused by SiGe layer," 2011 International Conference on Solid State and Device Materials, Nagoya, Japan, Sep. 28-30, 2011.

68. J.-S. Lee, T. Rim, S. Kim, K. Kim, C.-K. Baek, and M. Meyyappan, "Highly Sensitive BioFETs with Various Nanowire Structure," 3M NANO, Changchun, China, Aug. 29 - Sep. 2, 2011. (Invited talk)

69. K. Kim, T. Rim, S. Kim, H. Lee, U. Lee, E. Baek, Y.-H. Jeong, M. Meyyappan, and J.-S. Lee, "Development of Biologically-Active Si Nanowires Field-Effect Transistors (BioFETs) for detecting Carcinoembryonic Antigens (CEA)," Nano Korea Symposium, Ilsan KINTEX, Korea, Aug. 24-26, 2011.

70. K. Davami, D. Kang, J.-S. Lee and M. Meyyappan,, "ZnTe Nanowires Fabrication and Characterization of their Thermoelectric Properties," Nano Korea Symposium, Ilsan KINTEX, Korea, Aug. 24-26, 2011.

71. D. Kang, K. Davami, J. Kim, M. Meyyappan, and J.-S. Lee, "Synthesis and Electrical Characteristics of In2Se3 nanowires for phase change memory applications," Nano Korea Symposium, Ilsan KINTEX, Korea, Aug. 24-26, 2011.

72. R.-H. Baek, M.-D. Ko, S.-H. Lee, C.-K. Baek, K. H. Yeo, D. W. Kim, J.-S. Lee, and Y.-H. Jeong, "Analysis of Parasitic Bottom Capacitance in n- and p-type Si-Nanowire Field Effect Transistors on Bulk," 2011 11th IEEE International Conference on Nanotechnology, Portland, USA, Aug. 15-18, 2011.

73. K. Davami, S.H. Mir Shah Ghassemi, R. Shabazian Yassar, J.-S. Lee and M. Meyyappan, “In-Situ TEM Monitoring of Thermal Decomposition in CdTe and ZnTe Nanowires,” Microscopy and Microanalysis 2011, Nashville, Tennessee, U.S.A, Aug. 7-11, 2011.

74. C.-H. Park, M.-D. Ko, K. Kim, C.-W. Sohn, C.-K. Baek, Y.-H. Jeong, and J.-S. Lee, "Comparative study of fabricated junctionless and inversion-mode nanowire FETs,"  Device Research Conference, Santa Barbara, California, Jun. 20-22, 2011.

75. D. Y. Choi, M. S. Park, C.-W. Sohn, H.-C. Sagong, E.-Y. Jung, J.-S. Lee, Y.-H. Jeong, “Low-Frequency Noise Behavior of La-Doped HfSiON/Metal Gate nMOSFETs,” IEEE International Reliability Physics Symposium Proceedings, art. no. 5784602, pp. XT.1.1-XT.1.5, Apr. 2011.

76. S. H. Kim, K. Kim, T. Rim, C.-H. Park, D. H. Cho, C.-K. Baek, Y.-H. Jeong, M. Meyyappan, and J.-S. Lee, "pH Sensing and Noise Characteristics of Si Nanowire Ion-Sensitive Field Effect Transistors," The 6th IEEE-NEMS(IEEE International Conference 2011), Kaohsiung, Taiwan, Feb. 20-23, 2011.

[2010]

77. M. S. Park, C. Y. Kang, D.-Y. Choi, C.-W. Sohn, E.-Y. Jeong, J. Chung, J.-S. Lee, and Y.-H. Jeong, "Reliability properties in sub-50 nm high performance high-k metal gate stacks SiGe pMOSFETs," IEEE Nanotechnology Materials and Devices conference, pp. 38-41, Monterey, California, USA, Oct. 12-15, 2010.

78. R. H. Baek, C. K. Baek, S. H. Lee, S. D. Suk, M. Li, Y. Y. Yeoh, K. H. Yeo, D. W. Kim, J. S. Lee, D. M. Kim, and Y. H. Jeong, "C-V Characteristics and Analysis of Undoped Gate-All-Around Nanowire FET Array", in Proceedings of 2010 International Conference on Solid State Devices and Materials, Tokyo, Japan, Sep. 22-24, 2010.

79. R. H. Baek, H. S. Choi, H. C. Sagong, S. H. Lee, G. B. Choi, S. H. Song, C. H. Park, J. S. Lee, and Y. H. Jeong, "Characterization of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects", in Proceedings of 2010 IEEE International Reliability Physics Symposium, Anaheim, USA, May 2-6, 2010.

[2009]

80. G.-B. Choi, H.-C. Sagong, K. T. Lee, M. S. Park, H. S. Choi, S. H. Song, R.-H. Baek, C.-H. Park, S. H. Lee, J.-S. Lee, C. Y. Kang, H-H. Tseng, R. Jammy, and Y.-H. Jeong, "Impact of Dipole-induced Dielectric Relaxation on High-frequency Performance in La-incorporated HfSiON/Metal Gate nMOSFET," IEEE International Electron Devices Meeting 2009 (IEDM 2009), Baltimore, USA, Dec. 7-9, 2009.

81. R.-H. Baek, C.-K. Baek, S. W. Jung, Y. Y. Yeoh, D. W. Kim, J.-S. Lee, D. M. Kim, and Y.- H. Jeong, "Series Resistance Behavior Extracted from Silicon Nanowire Reansistors Using the Y-function Technique," in Proceedings of 2009 International Conference on Solid State Devices and Materials (SSDM 2009), Sendai, Japan, Oct. 7-9, 2009.

82. M. S. Park, Y. Kim, K. T. Lee, C. Y. Kang, B. G. Min, J. Oh, P. Majhi, H. H. Tseng, J. C. Lee, S. K. Banerjee, J.-S. Lee, R. Jammy, and Y.-H. Jeong, "Effects of Extension Profile Engineering to Suppress Boron TED on the Reliability of High-k/Metal Gate SiGe pMOSFETS," IEEE International Symposium on Advanced Gate Stack Technology, San francisco, California, USA, Aug. 23-26, 2009.